Término solicitado: SISTEMA INTERAMERICANO DE METROLOGIA/(65,175,265)
33 Registro/s encontrado/s en CAT+NORMA
| Tipo de Docum.: | documento de conferencia |
| Título: | Force standards comparison at 1 kN and 50 kN among national laboratories from EUROMET and SIM |
| Autor: | Villarroel-Poblete, C.; Torres-Guzman, , J. C.; Averlant, P.; Knott, A.; Kumme, R.; Robles-Carbonell, J. A.; Ramirez-Ahedo, D.; Giobergia, L. R. |
| Reunión: | International Conference IMEKO TC3, 20, International Conference IMEKO TC16, 3, International Conference IMEKO TC22, 1, Merida-MX, 2007 |
| Idioma: | eng |
| Datos de Edición: | s.l. IMEKO. 2007. |
| Pág./Vol.: | 8p. |
| Descriptores: | Laboratorios; Fuerza; Sistema Interamericano de Metrología; Incertidumbre; Mediciones; Transductores |
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URL: |
https://www.imeko.org/publications/tc3-2007/IMEKO-TC3-2007-081u.pdf |
| Tipo de Docum.: | artículo |
| Título: | Final report on SIM.AUV.A-K1 : LS1P microphone interlaboratory comparison |
| Autor: | Wong, George; Wu, Lixue |
| Autor Instit.: | National Institute of Standards and Technology. NIST. Estados Unidos; Centro Nacional de Metrología. CENAM. México; Instituto Nacional de Metrologia, Normalização e Qualidade Industrial. INMetro. Brasil; Instituto Nacional de Tecnología Industrial. INTI. Argentina; Institute for National Measurement Standards. INMS. Canadá |
| Título Ser./Col.: | Metrología, 44 |
| Autor Inst. Ser./Col.: | Bureau International des Poids et Mesures. BIPM. FR |
| Idioma: | eng |
| Datos de Edición: | s.l. IOP Publishing. 2007. |
| Pág./Vol.: | 29p. |
| Descriptores: | Metrología; Micrófonos; Laboratorios; Sistema Interamericano de Metrología; Frecuencia |
| Resumen: | The final results of Sistema Interamericano de Metrologia (SIM) interlaboratory comparison on microphone calibration SIM.AUV.A-K1 in the frequency range from 125 Hz to 8000 Hz are presented. Initially the comparison involved NORAMET countries: USA, Canada and Mexico. Later, the comparison was extended to include Argentina and Brazil, resulting in a SIM.AUV.A-K1 microphone interlaboratory comparison. The national metrology institutes (NMIs) of the five American countries that participated were the Institute for National Measurement Standards (INMS–Canada), National Institute of Standards and Technology (NIST–USA), Centro Nacional de Metrología (CENAM–Mexico), Instituto Nacional de Metrologia, Normalização e Qualidade Industrial (INMETRO–Brazil) and Instituto Nacional de Tecnología Industrial (INTI–Argentina). The INMS, Canada was the pilot laboratory that provided the data for this report. The final results were presented, discussed and agreed upon by all participants during a meeting held in INMETRO in October 2000. The maximum RMS deviation for the two LS1P laboratory standard microphones measured by the above participants is 0.037 dB. |
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https://iopscience.iop.org/article/10.1088/0026-1394/44/1A/09003 |
| Tipo de Docum.: | artículo |
| Título: | Guest editorial |
| Autor: | Jones, George R.; Lipe, Thomas; Landim, Regis; Di Lillo, Lucas |
| Título Ser./Col.: | IEEE Transactions on Instrumentation and Measuremente, 62(6) |
| Autor Inst. Ser./Col.: | IEEE |
| Idioma: | eng |
| Datos de Edición: | s.l. IEEE. 2013. |
| Pág./Vol.: | p. 1397-1399. |
| Descriptores: | Sistema Interamericano de Metrología; Metrología; Calibración; Patrones; Ángulos; Medidores; Mediciones; Instrumentos de medición |
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URL: |
https://ieeexplore.ieee.org/ielx7/19/6514981/06515002.pdf |
| Tipo de Docum.: | artículo |
| Título: | SIM.EM – S9b, 1 Ω and 10 kΩ : 2012 Resistance Bilateral Comparison between SIM/COOMET Laboratories. Comparison of Resistance Standards at 1 Ω and 10 kΩ between INIMET (Cuba) and INTI (Argentina) |
| Autor: | Tonina, A.; Currás, M.; Navarro, M. |
| Título Ser./Col.: | Metrología, 51 |
| Autor Inst. Ser./Col.: | Bureau International des Poids et Mesures. BIPM. Paris. FR |
| Idioma: | eng |
| Datos de Edición: | s.l. IOP Publishing. 2014. |
| Pág./Vol.: | 9p. |
| Descriptores: | Sistema Interamericano de Metrología; Metrología; Calibración; Patrones; Comparadores; Resistores |
| Resumen: | The CIPM MRA states that its technical basis is a set of results obtained in a course of time through key comparisons carried out by the Consultative Committees of the CIPM, the BIPM and the Regional Metrology Organizations (RMOs). As part of this process, INTI (Argentina) has participated in several key and supplementary comparisons. By means of procedures for linking key comparison data, a bilateral comparison would help to provide assurance of equality in measurements between the participating laboratories. With this end, the comparison SIM.EM-S9.b of 1 ohm and 10 kiloohm standard resistors of INIMET (Cuba) and INTI was carried out from March to October 2012. The obtained results were very good. They show that the resistance standards maintained by INTI and INIMET were equivalent, within their combined uncertainties, on the mean date of the comparison. |
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URL: |
https://iopscience.iop.org/article/10.1088/0026-1394/51/1A/01003 |
| Tipo de Docum.: | artículo |
| Título: | SIM.EM – S10 : RMO Comparison final report. High value resistance comparison with twoterminal cryogenic current comparators |
| Autor: | Bierzychudek, Marcos E.; Elmquist, Randolph; Hernández, Felipe |
| Título Ser./Col.: | Metrología, 51 |
| Autor Inst. Ser./Col.: | Bureau International des Poids et Mesures. BIPM. Paris. FR |
| Idioma: | eng |
| Datos de Edición: | s.l. IOP Publishing. 2014. |
| Pág./Vol.: | 36p. |
| Descriptores: | Sistema Interamericano de Metrología; Metrología; Calibración; Patrones; Comparadores; Resistores; Criogenia |
| Resumen: | This work presents a supplementary comparison of high value resistance standards performed during 2012 and January 2013, following the guidelines presented in a document about measurement comparisons in the CIPM MRA. The purpose of this task was to compare the high resistance cryogenic current comparator scaling of the participating institutes: National Institute of Standards and Technology, USA (NIST), Centro Nacional de Metrología, Mexico (CENAM) and Instituto Nacional de Tecnología Industrial, Argentina (INTI), all of which are members of the Sistema Interamericano de Metrología (SIM) Regional Metrology Organization. All the measurements of this comparison were performed with two-terminal cryogenic current comparators (CCC). Degrees of equivalence of the participating institutes relative to the comparison reference values are given in the report for the measured resistance values. |
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URL: |
http://iopscience.iop.org/0026-1394/51/1A/01004 |
| Tipo de Docum.: | artículo |
| Título: | SIM Regional Supplementary Comparison : SIM.L-S6. Calibration of gauge blocks by mechanical comparison |
| Autor: | Viliesid, Miguel; Colín Castellanos, Carlos; Chávez, T.; Chaudhary, K. P.; Dvořáček, Frantisek; Stoup, John; Santos Barros, Wellington; Vaudagna, Leandro; Morales, Roberto; Acquarone, Alejandro; Carrasco, J.; Vega, M.; Salazar, M.; Gil, V.; Dimas, J.; Reyes, E.; Hamilton, F.; Reddock, T.; Durga, S.; Burton, T. |
| Título Ser./Col.: | Metrología, 52 |
| Autor Inst. Ser./Col.: | Bureau International des Poids et Mesures. BIPM. Paris. FR |
| Idioma: | eng |
| Datos de Edición: | s.l. IOP Publishing. 2015. |
| Pág./Vol.: | 29p. |
| Descriptores: | Sistema Interamericano de Metrología; Metrología; Calibración; Ensayos mecánicos; Interferometría; Patrones |
| Resumen: | This supplementary comparison concerns the calibration of gauge blocks by mechanical comparison, which is a technique of paramount importance as it is at the highest level in the traceability chain of length for most countries of the American Continent. This comparison is designed to support the submitted CMC claims of these countries. The measurand is the central length of several gauge blocks as defined in ISO 3650 and the circulated gauge blocks were used for two comparisons carried out in two stages: the first stage, SIM.L-K1:2007, Calibration of gauge blocks by optical interferometry (2007–2010); the gauge blocks were also measured by mechanical comparison for those NMI also participating in SIM.L-S6:2007; the second stage, SIM.L-S6:2007, Calibration of gauge blocks by mechanical comparison (2010–2011) for the participants that measured only by mechanical comparison. In this second comparison there were 16 participants, 14 from the Americas, and 2 invited NMIs from other regions. The circulation in the second stage had 10 participants. |
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URL: |
https://iopscience.iop.org/article/10.1088/0026-1394/52/1A/04009/ |
| Tipo de Docum.: | documento de conferencia |
| Título: | Force standards comparison at 100 KN among national laboratories from Inter American Metrology System SIM |
| Autor: | Villarroel Poblete, Juan Christian; Oliva C., Hernán; Soto Pinto, Luis Rubén; Cárdenas, Alejandro; Torres Guzmán, Jorge C.; Dajes, Arístides; Savarín, Alejandro |
| Reunión: | IMEKO World Congress “Measurement in Research and Industry”, 21, Praga. CZ, 2015 |
| Idioma: | eng |
| Datos de Edición: | s.l. AR. s.n. 2015. |
| Pág./Vol.: | 1p. |
| Descriptores: | Sistema Interamericano de Metrología; Metrología; Calibración; Comparadores; Fuerza; Incertidumbre; Mediciones |
| Resumen: | A force comparison was carried out among various laboratories from Inter American System (SIM), in order to estimate the level of agreement for the realization of the quantity and the uncertainty associated to its measurement. The comparison was carried out in the ranges of 50 and 100 kN in compression. In order to achieve best accuracy of the force transducer the measurement range started in 50% of the maximum transducer range. The results obtained, the deviations graphs that include the uncertainty for each laboratory are presented in this document. |
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URL: |
https://www.imeko.org/publications/wc-2015/IMEKO-WC-2015-TC3-089.pdf |
| Tipo de Docum.: | artículo |
| Título: | Key Comparison : SIM.L-K3.2008. Calibration of angle standards. Report – Final |
| Autor: | Brum Vieira, Luiz Henrique; Stone, Jack; Viliesid, Miguel; Gastaldi, Bruno R.; Przybylska, Joanna; Chaudhary, K. P. |
| Título Ser./Col.: | Metrología, 52 |
| Autor Inst. Ser./Col.: | Bureau International des Poids et Mesures. BIPM. Paris. FR |
| Idioma: | eng |
| Datos de Edición: | s.l. IOP Publishing. 2015. |
| Pág./Vol.: | 42p. |
| Descriptores: | Sistema Interamericano de Metrología; Metrología; Calibración; Patrones; Ángulos; Medidores; Mediciones; Instrumentos de medición |
| Resumen: | In 2000, a key comparison, CCL-K3 (optical polygon and angle blocks) was started, piloted by NMISA. Based on it, in 2007, the SIM metrological region started a SIM.L-K3 key comparison piloted by INMETRO. The results of this regional comparison (RMO key comparison) contribute to the Mutual Recognition Arrangement (MRA) between the national metrology institutes of the Metre Convention. It is linked with the CCL-K3 key comparison via laboratories that participated in both the CIPM and the RMO comparisons. This common participation establishes the link between the comparisons and ensures equivalence of national metrology institutes, according to the MRA between NMIs. The SIM NMIs that took part in the CCL-K3 were NIST, NRC and CENAM. However, NRC withdrew from it. GUM from Poland (EURAMET) and NPLI from India (APMP) were invited to participate in the SIM.L-K3 key comparison. The circulation of artefacts (a 12 faces polygon and 4 angle blocks) started in 2008 and was completed in 2009. |
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URL: |
https://iopscience.iop.org/article/10.1088/0026-1394/52/1A/04008 |
| Tipo de Docum.: | artículo |
| Título: | Final report : SIM comparison in mass standards SIM.M.M-K4 |
| Autor: | Becerra, L. O.; Peña, L. M.; Luján, L.; Díaz, J. C.; Centeno, , L. M.; Loayza, V. M.; Cacais, F. A.; Ramos, O.; Rodriguez, S.; Garcia, F.; Leyton, F.; Santo, C.; Caceres, J.; Kornblit, F.; Leiblich, J.; Claude, J. |
| Título Ser./Col.: | Metrología, 53 |
| Autor Inst. Ser./Col.: | Bureau International des Poids et Mesures. BIPM. Paris. FR |
| Idioma: | eng |
| Datos de Edición: | s.l. IOP Publishing. 2016. |
| Pág./Vol.: | 7p. |
| Descriptores: | Sistema Interamericano de Metrología; Metrología; Kilogramo; Masa; Peso; Calibración; Precisión |
| Resumen: | This report summarizes the results of a SIM comparison in masss carried out between 7 NMIs. Five mass standards with nominal values 2 kg, 200 g, 50 g, 1 g and 200 mg have been circulated by the NMIs. The results reported by the participants are consistent with each other and with the key comparison reference valu of the comparison CCM.M-K5 to which the present comparison has been linked. |
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URL: |
https://iopscience.iop.org/article/10.1088/0026-1394/53/1A/07011 |
| Tipo de Docum.: | artículo |
| Título: | SIM.EM-K3 : key comparison of 10 mH. Inductance standards at 1 kHz. Final report |
| Autor: | Izquierdo, Daniel; Moreno, José Ángel; Castro, Blanca Isabel; de Barros e Vasconcellos, Renata; Cazabat, Marcelo; Koffman, Andrew; Cote, Marcel |
| Título Ser./Col.: | Metrología, 53 |
| Autor Inst. Ser./Col.: | Bureau International des Poids et Mesures. BIPM. Paris. FR |
| Idioma: | eng |
| Datos de Edición: | s.l. IOP Publishing. 2016. |
| Pág./Vol.: | 60p. |
| Descriptores: | Sistema Interamericano de Metrología; Inductancia; Frecuencia; Inductores eléctricos; Metrología; Mediciones |
| Resumen: | A key comparison of 10 mH inductance standards at 1 kHz has been carried out with the participation of seven National Metrology Institutes of the Inter-American Metrology System, within the frame of the International Committee for Weights and Measures Mutual Recognition Arrangement (MRA), which was piloted by CENAM, Mexico. Three previously characterized commercial inductors, contained in individual enclosures with controlled temperature were used as traveling standards. This document presents the results and technical details of the comparison. |
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URL: |
https://iopscience.iop.org/article/10.1088/0026-1394/53/1A/01002 |
| Tipo de Docum.: | artículo |
| Título: | Final report : key vomparison SIM.EM.RF-K5b.CL. scattering coefficients by broad-band methods. 2 GHz - 18 GHz - type N connector |
| Autor: | Silva, H.; Monasterios, G. |
| Título Ser./Col.: | Metrología, 53 |
| Autor Inst. Ser./Col.: | Bureau International des Poids et Mesures. BIPM. Paris. FR |
| Idioma: | eng |
| Datos de Edición: | s.l. IOP Publishing. 2016. |
| Pág./Vol.: | 105p. |
| Descriptores: | Sistema Interamericano de Metrología; Dispersión; Banda ancha; Frecuencia; Microondas; Metrología; Mediciones; Frecuencímetros |
| Resumen: | The first key comparison in microwave frequencies within the SIM (Sistema Interamericano de Metrología) region has been carried out. The measurands were the S-parameters of 50 ohm coaxial devices with Type-N connectors and were measured at 2 GHz, 9 GHz and 18 GHz. SIM.EM.RF-K5b.CL was the identification assigned and it was based on a parent CCEM key comparison named CCEM.RF-K5b.CL. For this reason, the measurements standards and their nominal values were selected accordingly, i.e. two one-port devices (a matched and a mismatched load) to cover low and high reflection coefficients and two attenuators (3dB and 20 dB) to cover low and high transmission coefficients. This key comparison has met the need for ensuring traceability in high-frequency measurements across America by linking SIM's results to CCEM. Six NMIs have participated in this comparison which was piloted by the Instituto Nacional de Tecnología Industrial (Argentina). A linking method of multivariate values was proposed and implemented in order to allow the linking of 2-dimensional results. |
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URL: |
https://iopscience.iop.org/article/10.1088/0026-1394/53/1A/01010 |
| Tipo de Docum.: | artículo |
| Título: | Final report : SIM comparison in mass standards SIM.M.M-K5 |
| Autor: | Becerra, L. O.; Peña, L. M.; Luján, L.; Díaz, J. C.; Centeno, , L. M.; Loayza, V. M.; Cacais, F. A.; Ramos, O.; Rodriguez, S.; Garcia, F.; Leyton, F.; Santo, C.; Caceres, J.; Kornblit, F.; Leiblich, J.; Claude, J. |
| Título Ser./Col.: | Metrología, 53(1A) |
| Autor Inst. Ser./Col.: | Bureau International des Poids et Mesures. BIPM. Paris. FR |
| Idioma: | eng |
| Datos de Edición: | s.l. IOP Publishing. 2016. |
| Pág./Vol.: | 13p. |
| Descriptores: | Sistema Interamericano de Metrología; Metrología; Kilogramo; Masa; Peso; Calibración; Unidades de medición |
| Resumen: | This report summarizes the results of a SIM comparison in masss carried out between 7 NMIs. Five mass standards with nominal values 2 kg, 200 g, 50 g, 1 g and 200 mg have been circulated by the NMIs. The results reported by the participants are consistent with each other and with the key comparison reference valu of the comparison CCM.M-K5 to which the present comparison has been linked. |
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URL: |
https://iopscience.iop.org/article/10.1088/0026-1394/53/1A/07011 |
| Tipo de Docum.: | artículo |
| Título: | SIM.EM-S5 Voltage, current and resistance comparison |
| Autor: | Sanchez, Harold; Cioffi, Jorge; Kyriazis, Gregory; Ramos, Rodrigo; Martínez, Alexander; Montaluisa, Julio; González, Julio; Postigo, Henry; Hamilton, Francis; Elmquist, Rand; Zhang, Nien-fan; Izquierdo, Daniel |
| Autor Instit.: | Instituto Costarricense de Electricidad. ICE. San José. CR; INTI-Física y Metrología. Buenos Aires. AR; Instituto Nacional de Metrologia, Normalização e Qualidade Industrial. INMETRO. Rio de Janeiro. BR; Laboratorio Custodio Patrón Nacional de Magnitudes Eléctricas. LCPN-ME. Campus Universitario Universidad de Concepción. CL; Superintendencia de Industria y Comercio. SIC. Bogotá. CO; Centro de Metrología del Ejército Ecuatoriano. CMEE. Quito. EC; Centro Nacional de Metrología de Panamá. CENAMEP. Panama City. PA; Servicio Nacional de Metrología. SNM, INDECOPI. Lima. PE; Trinidad and Tobago Bureau of Standards. TTBS. TT; National Institute of Standards and Technology. NIST. Gaithersburg. US; Administracion Nacional de Usinas y Trasmisiones Eléctricas. UTE. Montevideo. UY |
| Idioma: | eng |
| Datos de Edición: | New York. US. IEEE. 2012. |
| Pág./Vol.: | p.566-567. |
| Notas: | Este artículo puede ser consultado completo por usuarios internos al INTI. |
| Unidad técnica: | INTI-Física y Metrología. |
| Descriptores: | Sistema interamericano de metrología; Voltaje; Corriente eléctrica; Resistencia eléctrica; Mediciones eléctricas; Multímetros; Incertidumbre; Errores; Instrumentos de medición |
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URL: |
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6251055 |
| Ubicación: | 4748 |
| Disponibilidad: | Consulta in situ |
| Tipo de Docum.: | informe |
| Título: | Technical protocol: key comparison SIM.EM.RF-K5b.CL; scattering coefficients by broad-band methods 2 GHz - 18 GHz - Type N connector |
| Autor: | Silva, H.; Monasterios, G. |
| Autor Instit.: | INTI-Electrónica e Informática. Buenos Aires. AR |
| Idioma: | eng |
| Datos de Edición: | Buenos Aires. AR. INTI-Electrónica e Informática. 2012. |
| Pág./Vol.: | 16p. |
| Unidad técnica: | INTI-Electrónica e Informática. |
| Descriptores: | Sistema Interamericano de Metrología; Mediciones; Metrología; Radiofrecuencia; Frecuencia; Conectores; Normas; Dispositivos electrónicos; Incertidumbre; Covariancia |
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| Tipo de Docum.: | informe |
| Título: | La Metrología. El rol del INTI |
| Autor: | Laiz, Héctor |
| Autor Instit.: | Instituto Nacional de Tecnología Industrial. INTI. Buenos Aires. AR |
| Reunión: | Seminario Internacional de Metrología Química, 2, Córdoba. AR, 2011 |
| Idioma: | spa |
| Datos de Edición: | Buenos Aires. AR. INTI. 2011. |
| Pág./Vol.: | 40p. |
| Unidad técnica: | INTI. |
| Descriptores: | Metrología; INTI; Mediciones; Historia; Argentina; Reglamentación; Legislación; Leyes y decretos nacionales; Instrumentos de medición; Sistema métrico legal argentino; Unidades de medición; Metro; Sistema internacional de unidades; Kilogramo; Mol; Calibración; Sistema interamericano de metrología; Patrones |
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| Tipo de Docum.: | artículo |
| Título: | The SIM time network |
| Autor: | Lombardi, Michael A.; Novick, Andrew N.; López R., J. Mauricio; Jiménez, Francisco; López, Eduardo; Boulanger, Jean-Simon; Pelletier, Raymond; Carvalho, Ricardo J. de; Solís, Raúl; Sánchez, Harold; Quevedo, Carlos Andrés; Pascoe, Gregory; Pérez, Daniel; Bances, Eduardo; Trigo, Leonardo; Masi, Víctor; Postigo, Henry; Questelles, Anthony; Gittens, Anselm |
| Autor Instit.: | National Institute of Standards and Technology. NIST. Boulder, CO. US; Centro Nacional de Metrología. CENAM. Querétaro. MX; National Research Council. NRC. Ottawa. CA; National Observatory. ONRJ. Río de Janeiro. BR; Centro Nacional de Metrología de Panamá. CENAMEP. Panama City. PA; Instituto Costarricense de Electricidad. ICE. San José. CR; Superintendencia de Industria y Comercio. SIC. Bogotá. CO; Bureau of Standards Jamaica. BSJ. Kingston. JM; Instituto Nacional de Tecnología Industrial. INTI-Física y Metrología. Buenos Aires. AR; Laboratorio Nacional de Metrología. LNM. Guatemala City. GT; Administracion Nacional de Usinas y Trasmisiones Eléctricas . UTE. Montevideo. UY; Instituto Nacional de Tecnología Normalización y Metrología. INTN. Asunción. PY; Servicio Nacional de Metrología. SNM, INDECOPI. Lima. PE; Trinidad and Tobago Bureau of Standards. TTBS. TT; Saint Lucia Bureau of Standard. SLBS. Castries. LC |
| Título Ser./Col.: | Journal of Research of the National Institute of Standards and Technology, V.116(2) March-April 2011 |
| Idioma: | eng |
| Datos de Edición: | Gaithersburg. US. NIST. 2011. |
| Pág./Vol.: | 16p. |
| Notas: | Available online: http://www.nist.gov/jres. |
| Unidad técnica: | INTI-Física y Metrología. |
| Descriptores: | Sistema Interamericano de Metrología; Tiempo; Frecuencia; Internet; Trazabilidad; Metrología; Mediciones; Satélites artificiales; Sistemas computarizados; Incertidumbre; Calibración |
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| Tipo de Docum.: | documento de conferencia |
| Título: | El INTI en la primera comparación interamericana en aceleración en el marco del SIM |
| Autor: | Taibo, L. N.; Barceló, L. E. |
| Autor Instit.: | INTI-Física. Buenos Aires. AR |
| Reunión: | Instituto Nacional de Tecnología Industrial. INTI. Buenos Aires. AR, Jornadas de desarrollo e innovación, 4, Instrumentación, control y metrología, desarrollo de infraestructura tecnológica, precompetitivo, Parque Tecnológico Miguelete. AR, 2002 |
| Idioma: | spa |
| Datos de Edición: | Buenos Aires. AR. INTI. 2002. |
| Pág./Vol.: | 2p. |
| Unidad técnica: | INTI-Física. |
| Descriptores: | Sistema Interamericano de Metrología; INTI; Acústica; Acelerómetros; Amplificadores; Calibración; Interferometría |
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| Disponibilidad: | Consulta in situ |
| Tipo de Docum.: | documento de conferencia |
| Título: | Interlaboratorio en emisión de gases vehiculares con cromatografía gaseosa organizado por el Sistema Interamericano de Metrología (SIM) |
| Autor: | Barrera, F. P.; Mangano, E. G.; Malatto, M. L.; Lupi, O. D. |
| Autor Instit.: | INTI-Electrónica e Informática. Buenos Aires. AR |
| Reunión: | Instituto Nacional de Tecnología Industrial. INTI. Buenos Aires. AR, Jornadas de desarrollo e innovación, 5, Otras actividades tecnológicas, metrología aplicación interna, Parque Tecnológico Miguelete. AR, 2004 |
| Idioma: | spa |
| Datos de Edición: | Buenos Aires. AR. INTI. 2004. |
| Pág./Vol.: | 3p. |
| Unidad técnica: | INTI-Electrónica e Informática. |
| Descriptores: | Emisión; Gases; Vehículos; Cromatografía de gases; Sistema interamericano de metrología; Mediciones; Seguridad; Laboratorios |
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| Disponibilidad: | Consulta in situ |
| Tipo de Docum.: | artículo |
| Título: | International comparison of surface roughness and step height (depth) standards, SIML-S2 (SIM 4.8) |
| Autor: | Doytchinov, K.; Kornblit, F.; Colin Castellanos, C.; Oliveira, J.C.V.; Renegar, T.B.; Vorburger, T.V. |
| Autor Instit.: | Institute for National Measurement Standards, National Research Council. NRC. Ottawa. CA; Instituto Nacional de Technologia Industrial. INTI-Física y Metrología. Buenos Aires. AR; Centro Nacional de Metrología. CENAM. Querétaro. MX; National Institute of Metrology Standardization and Industrial Quality. INMETRO. Duque de Cacias. BR; National Institute of Standards and Technology. NIST. Gaithersburg. USA |
| Idioma: | eng |
| Datos de Edición: | s.l. AR. s.e. s.f. |
| Pág./Vol.: | 24p. |
| Unidad técnica: | INTI-Física y Metrología. |
| Descriptores: | Rugosidad de superficies; Sistema Interamericano de Metrología; Calibración; Mediciones; Normalización; Incertidumbre; Laboratorios; Normas |
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Trabajo de INTI |
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| Disponibilidad: | Consulta in situ |
| Tipo de Docum.: | informe |
| Título: | Report on SIM.L-K1 (SIM.4.2) regional comparison; Stage one: Calibration of gauge blocks by inteferometry; final report - 27 September 2006 |
| Autor: | Decker, J.E.; Altschuler, J.; Beladie, H.; Malinovsky, I.; Prieto, E.; Stoup, J.; Titov, A.; Villesid, M.; Pekelesky, J.R. |
| Autor Instit.: | Dimensional Metrology Program; Instituto Nacional de Tecnología Industrial. INTI. Buenos Aires. AR; Instituto Nacional de Metrología, Normalizaçâo e Qualidade Industrial. INMETRO. Rio de Janeiro. BR; Centro Español de Metrología. CEM. Madrid. ES; National Institute of Standards and Technology. NIST. Gaithersburg. US; Centro Nacional de Metrología. CENAM. Querétaro. MX; National Research Council. NRC. Ottawa. CA |
| Idioma: | eng |
| Datos de Edición: | s.l. AR. s.e. 2006. |
| Pág./Vol.: | 43p. |
| Unidad técnica: | INTI-Física. |
| Descriptores: | Calibres; Calibración; Interferometría; Calibradores; Mediciones; Sistema Interamericano de Metrología |
| Ver Documento
| |
Trabajo de INTI |
|
| Disponibilidad: | Consulta in situ |
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